Tag Archives: scan probe technology

New CMMs for 2013

Griffin is excited to announce the addition of two Zeiss CMMs with Scan Probe Technology for increased scanning capability.

  • Size, Location and Form can be measured in one pass.
  • More points probed means more complete feature geometry.
  • Greater Reliability, Accuracy, and Efficiency

CMM accuracy that matches or exceeds CNC machine tool accuracy.

See it in Action

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